Pieter de Visser


  1. Wideband on-chip terahertz spectrometer based on a superconducting filterbank
    A.Endo; K. Karatsu; Pascual Laguna, A.; B. Mirzaei; R. Huiting; D.J. Thoen; V. Murugesan; S.J.C. Yates; J. Bueno; N. van Marrewijk; S. Bosma; O. Yurduseven; N. Llombart; J. Suzuki; M. Naruse; P.J. de Visser; P.P. van der Werf; T.M. Klapwijk; and J.J.A. Baselmans;
    J. Astron. Telesc. Instrum. Syst.,
    Volume 5, Issue 3, pp. 35004-(1-12), 2019.

  2. Mitigation of cosmic ray effect on microwave kinetic inductance detector arrays
    K. Karatsu; A. Endo; J. Bueno; P.J. de Visser; R. Barends; D.J. Thoen; V. Murugesan; N. Tomita; J.J.A. Baselmans;
    Appl. Phys. Lett.,
    Volume 114, Issue 3, 2019.

  3. Performance of THz Components Based on Microstrip PECVD SiN x Technology
    Finkel, Matvey; Thierschmann, Holger; Galatro, Luca; Katan, Allard J; Thoen, David J; de Visser, Pieter J; Spirito, Marco; Klapwijk, Teun M;
    IEEE Transactions on Terahertz Science and Technology,
    Volume 7, Issue 6, pp. 765-771, 2017.

  4. Fluctuations in the electron system of a superconductor exposed to a photon flux.
    de Visser, P.J.; Baselmans, J.A.A.; Llombart Juan, J; Klapwijk, N;
    Nature Communications,
    Volume 5, Issue 3130, pp. 1-8, 2015.

  5. The non-equilibrium response of a superconductor to pair-breaking radiation measured over a broad frequency band
    P.J. de Visser; S.J.C. Yates; T. Guruswamy; D.J. Goldie; S. Withington; A. Neto; N. Llombart; A.M. Baryshev; T.M. Klapwijk; J.J.A. Baselmans;
    Applied Physics Letters 106, 252602,
    May 2015.

  6. Superconducting (Nb, Ti)N thin films for nanoscale experiments
    D.J. Thoen; A. Endo; J.J.A. Baselmans; A. Bruno; E.F.C. Driessen; E.A.F Haalebos; P.J. de Visser; T.M. Klapwijk;
    In Physics@FOM Veldhoven,
    Veldhoven, the Netherlands, January 2015.

  7. Microwave-induced excess quasiparticles in superconducting resonators measured through correlated conductivity fluctuations
    de Visser,PJ; Baselmans,JJA; Yates,SJC; Diener,P; Endo,A; Klapwijk,TM;
    Applied Physics Letters,
    Volume 100, Issue 16, pp. 1--4, 2012.

  8. Design of an integrated filterbank for DESHIMA: on chip submillimeter imaging spectrograph based on superconducting resonators
    Endo,A; van der werf,p; Janssen,RMJ; de Visser,PJ; Klapwijk,TM; Baselmans,JJA; Ferrari,L; Baryshev,AM; Yates,SJC;
    Low Temperature Physics,
    Issue 167, pp. 341--346, 2012.

  9. Generation-Recombination Noise: The Fundamental Sensitivity Limit for Kinetic Inductance Detectors
    de Visser,PJ; Baselmans,JJA; Diener,P; Endo,A; Klapwijk,TM;
    Journal of Low Temperature Physics,
    Volume 167, Issue 3-4, pp. 335--340, 2012.

  10. Power Handling and Responsivity of Submicron Wide Superconducting Coplanar Waveguide Resonators
    Janssen,RMJ; Endo,A; baselsmans,J.J.A.; de Visser,PJ; Barends,R; Klapwijk,TM;
    Journal of Low Temperature Physics,
    Volume 137, Issue 3-4, pp. 354--359, 2012.

  11. Development of DESHIMA: a redshift machine based on a superconducting on-chip filterbank
    Endo,A; Baselmans,JJA; van der werf,PP; Knoors,B; Javadzadeh,SMH; Yates,SJC; Thoen,DJ; Ferrari,L; Baryshev,AM; Lankwarden,YJY; de Visser,PJ; Janssen,RMJ; Klapwijk,TM;
    In Holland,W.S.; Zmuidzinas,J. (Ed.), Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VI,
    s.l., SPIE Press, pp. 1--15, 2012.

  12. Number fluctuations of sparse quasiparticles in a superconductor
    de Visser,PJ; Baselmans,JJA; Diener,P; Yates,SJC; Endo,A; Klapwijk,TM;
    Physical Review Letters,
    Volume 106, Issue 16, pp. 167004-1--16700, 2011.

  13. Minimal resonator loss for circuit quantum electrodynamics
    Barends,R; Vercruyssen,N; Endo,A; de Visser,PJ; Zijlstra,T; Klapwijk,TM; Diener,P; Yates,SJC; Baselmans,JJA;
    Applied Physics Letters,
    Volume 97, Issue 2, pp. 023508-1--02350, 2010.

  14. Reduced frequency noise in superconducting resonators
    Barends,R; Vercruyssen,N; Endo,A; de Visser,PJ; Zijlstra,T; Klapwijk,TM; Baselmans,JJA;
    Applied Physics Letters,
    Volume 97, Issue 3, pp. 033507-1--03350, 2010.

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